FT-371四探針測試儀是一(yi)(yi)種針對(dui)于產(chan)品(pin)性能測試的儀(yi)器(qi)，這款(kuan)儀(yi)器(qi)實用性強，瑞柯(ke)儀(yi)器(qi)一(yi)(yi)直(zhi)在研發新品(pin)，如果你(ni)對(dui)我們(men)的儀(yi)器(qi)感興(xing)趣，歡迎，下面讓(rang)我們(men)看下新品(pin)的性能和參(can)數吧。

一、概述

本品為解決四探針(zhen)法測(ce)試超高阻(zu)(zu)值材(cai)(cai)料(liao)方(fang)阻(zu)(zu)及電阻(zu)(zu)率，zui大(da)可(ke)以測(ce)試到(dao)1010Ω方(fang)阻(zu)(zu)值，是目前同行業中能測(ce)量(liang)(liang)到(dao)的(de)zui大(da)方(fang)阻(zu)(zu)值，選購：本機還可(ke)以配合各類(lei)環(huan)境溫(wen)度試驗箱(xiang)體使用，通(tong)過不同的(de)測(ce)量(liang)(liang)治(zhi)具(ju)(ju)滿足(zu)不同環(huan)境溫(wen)度下測(ce)量(liang)(liang)方(fang)阻(zu)(zu)和電阻(zu)(zu)率的(de)需求.采用高精度AD芯片控制，恒流輸(shu)出(chu)，結構合理、質量(liang)(liang)輕便，運輸(shu)安全、使用方(fang)便；適用于生產企業、高等院校、科(ke)研部(bu)門，是檢(jian)驗和分析(xi)導體材(cai)(cai)料(liao)和半導體材(cai)(cai)料(liao)質量(liang)(liang)的(de)一種重要的(de)工具(ju)(ju)。本儀(yi)器配置(zhi)(zhi)各類(lei)測(ce)量(liang)(liang)裝置(zhi)(zhi)可(ke)以測(ce)試不同材(cai)(cai)料(liao)。

液(ye)晶顯(xian)示，無(wu)(wu)需(xu)人工計(ji)算(suan)，并(bing)帶有(you)溫(wen)度(du)補償功(gong)能(neng)，電(dian)(dian)阻率單位(wei)(wei)自動(dong)選擇，儀器自動(dong)測(ce)(ce)量并(bing)根據測(ce)(ce)試(shi)結果自動(dong)轉(zhuan)換(huan)量程，無(wu)(wu)需(xu)人工多次和重復設置。選配(pei)：配(pei)備軟(ruan)件(jian)可以由電(dian)(dian)腦操控，并(bing)保存和打印數(shu)據，自動(dong)生成報表；本(ben)儀器采(cai)用(yong)4.3吋大(da)液(ye)晶屏(ping)幕顯(xian)示，同時顯(xian)示液(ye)晶顯(xian)示：電(dian)(dian)阻、電(dian)(dian)阻率、方阻、溫(wen)度(du)、單位(wei)(wei)換(huan)算(suan)、溫(wen)度(du)系數(shu)、電(dian)(dian)流、電(dian)(dian)壓、探針(zhen)形狀、探針(zhen)間距(ju)、厚度(du) 、電(dian)(dian)導率，配(pei)置不(bu)同的測(ce)(ce)試(shi)治具可以滿足不(bu)同材(cai)料的測(ce)(ce)試(shi)要求(qiu)。測(ce)(ce)試(shi)治具可以根據產品及測(ce)(ce)試(shi)項(xiang)目要求(qiu)選購。

雙電測數字式四探針測試儀是運用(yong)(yong)直線或(huo)方形四探(tan)針(zhen)雙位測(ce)量。該儀器設計符合單(dan)晶硅物理(li)測(ce)試方法標(biao)準并參考美國(guo) A.S.T.M 標(biao)準。利用(yong)(yong)電(dian)流探(tan)針(zhen)、電(dian)壓探(tan)針(zhen)的變換，進(jin)(jin)行兩次(ci)電(dian)測(ce)量，對數據進(jin)(jin)行雙電(dian)測(ce)分(fen)析，自(zi)動消除樣品幾何尺寸、邊界效應以及探(tan)針(zhen)不等(deng)距和(he)機(ji)械游移(yi)等(deng)因素對測(ce)量結果的影響(xiang)，它與單(dan)電(dian)測(ce)直線或(huo)方形四探(tan)針(zhen)相比(bi)，大大提(ti)高度，特別是適用(yong)(yong)于(yu)斜(xie)置式(shi)四探(tan)針(zhen)對于(yu)微區的測(ce)試。

二、應用

FT-371四探針測試儀廣泛用于覆(fu)蓋膜(mo)(mo);導(dao)(dao)(dao)(dao)(dao)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)高分子膜(mo)(mo)，高、低溫電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)熱膜(mo)(mo);隔(ge)熱、防輻(fu)射導(dao)(dao)(dao)(dao)(dao)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)窗膜(mo)(mo) 導(dao)(dao)(dao)(dao)(dao)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(屏(ping)蔽)布、裝飾(shi)膜(mo)(mo)、裝飾(shi)紙(zhi);金(jin)屬(shu)化標簽、合金(jin)類箔膜(mo)(mo);熔煉(lian)、燒(shao)結(jie)、濺射、涂(tu)(tu)覆(fu)、涂(tu)(tu)布層(ceng)，電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)阻(zu)式、電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)容式觸屏(ping)薄膜(mo)(mo);電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)極涂(tu)(tu)料(liao)(liao)，其他半(ban)導(dao)(dao)(dao)(dao)(dao)體(ti)材料(liao)(liao)、薄膜(mo)(mo)材料(liao)(liao)方(fang)(fang)阻(zu)測(ce)試、硅晶塊(kuai)、晶片電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)阻(zu)率(lv)及擴散(san)層(ceng)、外(wai)延層(ceng)、ITO導(dao)(dao)(dao)(dao)(dao)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)箔膜(mo)(mo)、導(dao)(dao)(dao)(dao)(dao)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)橡膠等(deng)材料(liao)(liao)方(fang)(fang)塊(kuai)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)阻(zu)  半(ban)導(dao)(dao)(dao)(dao)(dao)體(ti)材料(liao)(liao)/晶圓(yuan)、太陽能電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)池、電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)子元(yuan)器件，導(dao)(dao)(dao)(dao)(dao)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)薄膜(mo)(mo)（ITO導(dao)(dao)(dao)(dao)(dao)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)膜(mo)(mo)玻璃等(deng)），金(jin)屬(shu)膜(mo)(mo)，導(dao)(dao)(dao)(dao)(dao)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)漆膜(mo)(mo)，蒸發鋁膜(mo)(mo)，PCB銅(tong)箔膜(mo)(mo)，EMI涂(tu)(tu)層(ceng)等(deng)物質的薄層(ceng)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)阻(zu)與電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)阻(zu)率(lv)  導(dao)(dao)(dao)(dao)(dao)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)性油漆，導(dao)(dao)(dao)(dao)(dao)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)性糊狀物，導(dao)(dao)(dao)(dao)(dao)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)性塑料(liao)(liao)，導(dao)(dao)(dao)(dao)(dao)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)性橡膠，導(dao)(dao)(dao)(dao)(dao)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)性薄膜(mo)(mo)，金(jin)屬(shu)薄膜(mo)(mo)，抗靜電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)材料(liao)(liao)， EMI 防護材料(liao)(liao)，導(dao)(dao)(dao)(dao)(dao)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)性纖維，導(dao)(dao)(dao)(dao)(dao)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)性陶瓷(ci)等(deng)。

三、參數資料

1.方塊電阻范圍：101～2×1010Ω/□。

2.電阻率范圍(wei)：102～2×1011Ω-cm。

3.測試電(dian)流(liu)范圍：1mA ---1pA。

4.電流精度：±0.1%讀數。

5.電阻(zu)精度：108Ω以下(xia)≤5% ；108Ω以上(shang)≤20%。

6.顯示(shi)讀數：液(ye)晶顯示(shi)：電(dian)(dian)阻、電(dian)(dian)阻率、方阻、溫度(du)、單位換算、溫度(du)系(xi)數、電(dian)(dian)流、電(dian)(dian)壓、探針形狀、探針間距、厚度(du) 、電(dian)(dian)導率。

7.測(ce)試方式: 雙電測(ce)量。

8.工(gong)作電源: 輸入: AC 220V±10% ,50Hz  功(gong) 耗：<30W。

9.整(zheng)機不確定性誤差: ≤4%（標準樣片結(jie)果）。

10.選購功能: 選購1.pc軟件(jian)； 2.方(fang)形(xing)探(tan)頭(tou)； 3.直線(xian)形(xing)探(tan)頭(tou)； 4.測試平(ping)臺(tai)。

11.測試探(tan)(tan)頭(tou)：  探(tan)(tan)針(zhen)(zhen)(zhen)間距(ju)選(xuan)購(gou)：1mm；2mm；3mm三種規(gui)格; 探(tan)(tan)針(zhen)(zhen)(zhen)材質選(xuan)購(gou)：碳(tan)化鎢針(zhen)(zhen)(zhen);白鋼針(zhen)(zhen)(zhen)；鍍金磷銅半球形(xing)針(zhen)(zhen)(zhen)。